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Beilstein J. Nanotechnol. 2024, 15, 126–133, doi:10.3762/bjnano.15.12
Figure 1: (a) Scanning electron microscopy (SEM) micrograph showing top view and cross section (inset, same s...
Figure 2: Experimental and simulated (fitted) reflectance spectra from Al–PAAO samples in electrolyte solutio...
Figure 3: (a) Example of a real-time measurement of PAAO layer thickness and current through a 1 cm2 anode du...
Figure 4: Thickness maps of total PAAO layer and barrier layer obtained using spectroscopic ellipsometry from...
Figure 5: Schematic diagram of the anodizing apparatus.
Beilstein J. Nanotechnol. 2017, 8, 145–158, doi:10.3762/bjnano.8.15
Figure 1: Optical images for (a) sample A, (b) sample B as deposited on copper foil.
Figure 2: Raman spectrum for (a) sample A, (b) sample B on copper foil. The luminescence background from copp...
Figure 3: (a) The Rayleigh image. (b) I2D/IG ratio map. (c) FWHM map of the 2D band. (d) 2D band position map...
Figure 4: Raman mapping histograms for sample A on a SiO2/Si substrate as obtained from Raman maps of Figure 2. (a) G...
Figure 5: Raman maps of sample B on a SiO2/Si substrate acquired at a laser excitation wavelength of 473 nm. ...
Figure 6: Raman mapping histograms for sample B on a SiO2/Si substrate as obtained from Raman maps of Figure 4. (a) G...
Figure 7: Replotted histograms of sample A on SiO2/Si substrate for laser excitation wavelength of 473 nm usi...
Figure 8: Replotted histograms of sample B on a SiO2/Si substrate for a laser excitation wavelength of 473 nm...
Figure 9: High-resolution C 1s XPS spectra of samples on a SiO2/Si substrate. (a) Raw data sample A (black cr...
Figure 10: High-resolution N 1s XPS spectra of samples on SiO2/Si substrate. (a) Raw data for sample A (black ...
Figure 11: Raman spectra of sample B on SiO2/Si substrate. (a) Raman spectra of SLG (black) and double layer g...
Figure 12: The transmittance of sample B versus wavelength on a glass substrate. The vertical dashed line indi...